Spectral Fingerprints of Resonant Defect Scattering by Substitutional Mn in Graphene

Using substitutional Mn in graphene/Cu(111) as a model point defect, we combine scanning tunneling microscopy (STM) and angle-resolved photoemission spectroscopy (ARPES) to test the predicted fingerprints of resonant scattering. As the Mn concentration increases to 0.44%, the Dirac point stretching reaches 0.52 eV, while momentum broadening remains energy independent. These spectral fingerprints classify substitutional Mn as a strong resonant scatterer and establish the combination of STM and ARPES as a powerful approach to identify and characterize resonant disorder in graphene.